Field-induced charged-device model test method for electrostatic discharge withstand thresholds of microelectronic components

Publisher:
International Electrotechnical Commission - Publicly Available Standard

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

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Describes a uniform method for establishing charged-device model (CDM) electrostatic discharge (ESD) withstand thresholds. All packages semiconductor components, thin film circuits, surface acoustic wave (SAW) components, opto-electronic components, hybrid integrated circuits (HICS), and multi-chip modules (MCMs) containing any of these components are to be evaluated according to this standard. IEC/PAS 62162 will be re-issued in the form of IEC international standard under reference IEC 60748-20.

Edition :	1.0
File Size :	1 file , 120 KB
Note :	This product is unavailable in Canada
Number of Pages :	7
Published :	08/22/2000

IEC/PAS 62162 Ed. 1.0 en:2000 PDF

Field-induced charged-device model test method for electrostatic discharge withstand thresholds of microelectronic components

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